Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market.
Nanometrics is a publicly traded company (since 1984) and is listed on the NASDAQ Global Select Market under the symbol NANO.
Jul 23, 2015 at 4:30 PM ET
Nanometrics Q2 2015 Conference Call
Jul 15, 2015
7th Annual CEO Investor Summit 2015
Jun 3, 2015 at 12:30 PM ET
Nanometrics 2015 Analyst Day