Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs.
Nanometrics is a publicly traded company (since 1984) and is listed on the NASDAQ Global Select Market under the symbol NANO.
May 14, 2013
Nanometrics Announces Upcoming Investor Events
May 30, 2013 at 9:30 AM ET
Cowen and Company 41st Annual Technology, Media & Telecom Conference
May 29, 2013
D. A. Davidson 5th Annual Technology Forum
Apr 30, 2013 at 1:30 PM PT
Nanometrics Q1 2013 Conference Call