Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market.
Nanometrics is a publicly traded company (since 1984) and is listed on the NASDAQ Global Select Market under the symbol NANO.
Nov 20, 2013
Nanometrics Announces Upcoming Investor Events
Dec 11, 2013
2nd Annual Midtown CAP Summit
Dec 4, 2013
2013 Credit Suisse Annual Technology Conference
Oct 29, 2013 at 4:30 PM ET
Nanometrics Q3 2013 Conference Call