Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market.
Nanometrics is a publicly traded company (since 1984) and is listed on the NASDAQ Global Select Market under the symbol NANO.
Apr 29, 2014 at 4:30 PM ET
Nanometrics Q1 2014 Conference Call
Feb 10, 2014 at 1:00 PM PT
Stifel 2014 Technology, Internet & Media Conference
Feb 4, 2014 at 4:30 PM ET
Nanometrics Q4 2013 Conference Call