MILPITAS, Calif., Nov. 16, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that company management will participate in the 6th Annual NYC Investor Summit, taking place December 6, 2017 at Le Parker Méridien Hotel, New York City.
The presentation material utilized during the NYC Summit will be made accessible on the investor page of the company's website at www.nanometrics.com.
About the 6th Annual NYC Summit
The NYC Summit is hosted by executive management from participating companies and will feature a "round-robin" format consisting of small group meetings, each 30 minutes in duration. During the event, investors and analysts will have the opportunity to meet with up to 10 of the 15 management teams during the 30-minute group meeting sessions, as well as opportunities to meet with additional management teams during the breakfast and lunch networking sessions.
The 15 management teams collectively hosting the 2017 NYC Summit include: Aehr Test (AEHR), Axcelis (ACLS), BE Semiconductor Industries (BESI.AS), Brooks (BRKS), Camtek (CAMT), Cohu (COHU), Electro Scientific (ESIO), FormFactor (FORM), Ichor Systems (ICHR), Intermolecular (IMI), inTEST (INTT), Intevac (IVAC), Kulicke & Soffa (KLIC), Nanometrics (NANO), and Rudolph Technologies (RTEC). Cowen is sponsoring the networking luncheon.
The NYC Investor Summit is by invitation only and is open to accredited investors and publishing research analysts. As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is November 27, 2017.
RSVP Contacts for 6th Annual NYC Summit 2017
To RSVP for the NYC Summit, please contact either of the Summit's co-chairs.
|Laura J. Guerrant-Oiye||Claire E. McAdams|
|Guerrant Associates||Headgate Partners LLC|
|Phone: (808) 960-2642||Phone: (530) 265-9899|
|Email: firstname.lastname@example.org||Email: email@example.com|
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.
|Investor Relations Contact:||Company Contact:|
|Claire McAdams||Jeff Andreson|
|Headgate Partners LLC||CFO|