MILPITAS, Calif., Feb. 27, 2018 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that company management will participate in the 30th Annual ROTH Conference, taking place at the Ritz Carlton Laguna Niguel, Orange County, CA from March 11th through the 14th, 2018. Company management is scheduled to present at 11:30 AM PDT on Tuesday, March 13th, 2018.
A live and archived webcast of the presentation, along with the presentation material utilized during the conference, will be made accessible on the investor page of the company’s website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.
Investor Relations Contact:
Claire McAdamsHeadgate Partners LLC
SVP, Corporate Development
Source: Nanometrics Incorporated