July 10, 2017

Nanometrics Expands Position in Advanced Memory Devices with Atlas for Thin Film Process Control

Atlas Films Systems Adopted by Multiple Customers for Advanced Memory Volume Manufacturing

MILPITAS, Calif., July 10, 2017 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems, today announced that its Atlas® systems have been adopted by multiple leading memory manufacturers for production control of thin film deposition processes. Complementing the large installed base of Atlas tools, the Atlas MPU and Atlas III systems are new members of a fleet of solutions that Nanometrics has deployed to enable yield learning and factory control across multiple process steps of the industry's advanced 3D-NAND and DRAM devices.

The Atlas MPU and the Altas III platforms are extensions to the widely deployed Atlas product line, delivering higher productivity and improved thin film metrology performance. Using a common platform architecture strategy, the Atlas MPU is targeted to film applications in customer fabs which have already deployed Atlas XP+ systems into high-volume manufacturing. The Atlas III provides enhanced performance and productivity over the Atlas II+ by enabling sub-angstrom level process control and film metrology capabilities suitable for the most challenging leading-edge device applications. Atlas MPU and Atlas III both leverage Nanometrics' industry-leading NanoDiffract® OCD modeling capabilities.

"The Atlas MPU and Atlas III systems for thin film metrology significantly lowers overall cost-of-ownership and increases operational flexibility within volume manufacturing," commented Dr. Srini Vedula, vice president, Thin Film & OCD Solutions, at Nanometrics. "Our customers recognize the benefit and value of extending their metrology capabilities with new platforms compatible with their existing Atlas fleet. By working closely with them on upgradable options and new system performance, the Atlas MPU and Atlas III enable our customers to maximize their existing investments in our Atlas platforms and solutions while providing significant fab-wide performance and productivity improvements." 

For a review of all Atlas metrology systems and the full suite of process control metrology systems, visit Nanometrics at SEMICON West July 11-13, Moscone Center, San Francisco, booth #5844 North hall.

About Nanometrics
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components.  Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.

Forward Looking Statements
Certain statements in this press release are forward-looking statements that involve a number of risks and uncertainties that could cause actual results to differ materially from those described in this release.  Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, actual results could differ materially from these expectations due to a variety of factors, including, but not limited to: failure of customers to adopt the new products; decreased levels of industry spending; Nanometrics' inability to gain additional market share, increase sales, ship products as scheduled, achieve customer acceptance of new products or outperform the industry; decreased demand for Nanometrics' products; shifts in the timing of customer orders and product shipments; technology adoption rates; changes in customer and product mix; changes in market share; changes in operating expenses; and general economic conditions. For additional information and considerations regarding the risks faced by Nanometrics that could cause actual results to differ materially, see its annual report on Form 10-K for the year ended December 31, 2016, as filed with the Securities and Exchange Commission on March 3, 2017 including under the caption "Risk Factors," as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement, except as required by law.             

Investor Relations Contact:

Claire McAdams

Headgate Partners LLC

530.265.9899

claire@headgatepartners.com



Company Contact:

Kevin Heidrich

SVP Marketing

503.207.4611

kheidrich@nanometrics.com

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Source: Nanometrics Incorporated

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