November 17, 2016

Nanometrics to Participate in 5th Annual Midtown CAP Summit NYC

MILPITAS, Calif., Nov. 17, 2016 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control systems, today announced that company management is scheduled to participate in the 5th Annual Midtown CAP Summit, being held December 8, 2016 at the Le Parker Méridien Hotel, New York, NY.

The presentation material utilized during the Summit will be made accessible on the investor page of Nanometrics' website at www.nanometrics.com.

About the Midtown CAP Summit
The Midtown CAP Summit is hosted by executive management from the following participating companies: Aehr Test Systems (AEHR), Axcelis (ACLS), Advanced Energy Industries (AEIS), Brooks Automation (BRKS), Camtek Ltd (CAMT), Cohu (COHU), Electro Scientific Industries (ESIO), FormFactor (FORM), inTEST Corporation (INTT), Intevac (IVAC), Kulicke & Soffa (KLIC), Nanometrics (NANO), Rudolph Technologies (RTEC), Ultratech (UTEK), and Xcerra Corporation (XCRA), and will feature a "round-robin" format consisting of a series of small group meetings.

The Midtown CAP Summit is by invitation only and is open to accredited investors and publishing research analysts.  As space is limited, please RSVP early. Hosts reserve the right to limit attendance. Last day for registration is November 28.  To RSVP for the Midtown CAP Summit, please contact the event's co-chairs:

         
Laura J. Guerrant-Oiye       Claire E. McAdams
Guerrant Associates       Headgate Partners LLC
Phone: (808) 882-1467       Phone: (530) 265-9899
Email:  lguerrant@guerrantir.com       Email: claire@headgatepartners.com
         

About Nanometrics
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components.  Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.

Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899
claire@headgatepartners.com

Company Contact:
Jeffrey Andreson, CFO
Nanometrics Incorporated
408.545.6143
jandreson@nanometrics.com


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