Nanometrics

Press Releases

All Releases
View Summary Nanometrics to Announce Third Quarter 2012 Financial Results on October 30, 2012
Oct 12, 2012
PDF 8.5 KB Add to Briefcase
View Summary Nanometrics Announces Upcoming Investor Events
Jul 30, 2012
PDF 7.5 KB Add to Briefcase
View Summary Nanometrics Reports Second Quarter 2012 Financial Results
Jul 26, 2012
PDF 15.7 KB Add to Briefcase
View Summary Nanometrics’ SPARK Inspection System Qualified by Leading Semiconductor Manufacturer for Advanced 3D Wafer-Scale Packaging Process Control
Jun 26, 2012
PDF 8.8 KB Add to Briefcase
View Summary Nanometrics Announces $20 Million Share Repurchase Program
May 29, 2012
PDF 8.5 KB Add to Briefcase
View Summary Nanometrics Announces Upcoming Investor Events
May 15, 2012
PDF 7.4 KB Add to Briefcase
View Summary Nanometrics’ IMPULSE Integrated Metrology System Selected by Leading Foundry for Advanced 2x nm Etch Control
May 7, 2012
PDF 8.5 KB Add to Briefcase
View Summary Nanometrics Reports First Quarter 2012 Financial Results
Apr 26, 2012
PDF 15.4 KB Add to Briefcase
View Summary Nanometrics to Host Investor and Analyst Meeting
Mar 1, 2012
PDF 7.2 KB Add to Briefcase
View Summary Nanometrics Reports Fourth Quarter and Full Year 2011 Financial Results
Feb 8, 2012
PDF 15.3 KB Add to Briefcase
View Summary Nanometrics to Present at the Stifel Nicolaus 2012 Technology & Telecom Conference
Jan 23, 2012
PDF 7.2 KB Add to Briefcase
View Summary Nanometrics Announces Advanced Metrology Milestone
Jan 9, 2012
PDF 9.8 KB Add to Briefcase
View Summary Nanometrics Acquires Nanda Technologies
Nov 21, 2011
PDF 10.5 KB Add to Briefcase
View Summary Nanometrics Introduces Atlas II OCD System
Nov 8, 2011
PDF 9.9 KB Add to Briefcase
View Summary Nanometrics TSM Metrology System Selected by Major Solar PV Manufacturer
Oct 31, 2011
PDF 9.4 KB Add to Briefcase
View Summary Nanometrics Reports Third Quarter 2011 Financial Results
Oct 27, 2011
PDF 13.3 KB Add to Briefcase
View Summary Nanometrics to Present at Upcoming Investor Conferences
Oct 25, 2011
PDF 7.4 KB Add to Briefcase
View Summary Nanometrics Atlas XP+ OCD System Selected as “Tool of Record” at Leading Disk Drive Manufacturer
Oct 5, 2011
PDF 9.0 KB Add to Briefcase
View Summary Nanometrics Wins Multi-System Order for Integrated Metrology
Sep 26, 2011
PDF 8.8 KB Add to Briefcase
View Summary Nanometrics OCD Metrology Systems Selected by Asian Foundry
Sep 14, 2011
PDF 8.5 KB Add to Briefcase
Showing 81-100 of 171 Page: 1 2 3 4 5 6 7 8 9  Previous 20 | Next 20
Add to Briefcase = add release to Briefcase